XRD Investigation of Thermal Relaxation Behavior of Microstructure in TiB2/Al Deformation Layer Introduced by Shot Peening

Author:  W. Luan, C. Jiang, X. Chen
Source:  Conf Proc 2011: ICSP-11 South Bend, IN USA (pgs. 141-146)
Doc ID:  2011023
Year of Publication:  2011
Abstract:  
Abstract: The investigation of microstructure thermostability and residual stresses relaxation of TiB2/Al composite were carried out via X-ray diffraction and XRD line profile analysis. Results showed that with increasing the heating temperature and time, domain size increased and microstrian as well as dislocation density decreased, respectively. During annealing, the peened microstructures recovered and recrystallized. Because of the pinning effect of the reinforcement particles, the growth of domain size of alloy was faster than that of composite during annealing. For alloy and composite, the domains had grown to 16 and 4 times after annealing, respectively. Using modified Warren-Averbach method, the calculated domains of alloy and composite grow to 16 and 4 times after HT. Using Voigt method, the calculated domains of alloy and composite grow to 12 and 8 times after HT. Keywords: thermal relaxation, Line profile analysis, shot peening, TiB2/Al composite.